ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,574, issued on July 21, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan). "Semiconductor testing apparatus... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,575, issued on July 21, was assigned to Infineon Technologies AG (Neubiberg, Germany). "Controlled switching of stress voltages in lateral ... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,576, issued on July 21, was assigned to MATERIALS ANALYSIS TECHNOLOGY INC. (Zhubei City, Taiwan). "Testing device and testing system" was i... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,577, issued on July 21, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Method, device, and system for detecting fus... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,578, issued on July 21, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Wrapper cell design and built-in se... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,579, issued on July 21, was assigned to ABB Schweiz AG (Baden, Switzerland). "Method and system for detecting stator inter-turn fault in in... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,580, issued on July 21, was assigned to SK On Co. Ltd. (Seoul, South Korea). "Secondary battery cell insulation test apparatus and method u... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,581, issued on July 21, was assigned to Analog Devices Inc. (Wilmington, Mass.). "Technique for estimation of internal battery temperature"... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,582, issued on July 21, was assigned to GS YUASA INTERNATIONAL LTD. (Kyoto, Japan). "Correction method for estimated state-of-charge value ... Read More
ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,583, issued on July 21, was assigned to The Boeing Co. (Arlington, Va.). "Multi-module battery system testing" was invented by Robert J. At... Read More